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| Chinese National Standard Category: Semiconductor integrated circuit |
| English Title: | Integrated circuits—Measurement of impulse immunity—Part 2: Synchronous transient injection method |
| Chinese Title: | 集成电路 脉冲抗扰度测量 第2部分: 同步瞬态注入法 |
| Standard No.: | GB/T 43034.2-2024 |
| Category No.: | L56 |
| Issued by: | SAMR; SAC |
| Issued on: | 2024-10-26 |
| Implemented on: | 2024-10-26 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 14500 words |
| Similar Standards: | T/SZAA 002-2024 GB/T 44807.1-2024 GB/T 44806.1-2024 GB/T 44801-2024 GB/T 44798-2024 GB/T 44795-2024 GB/T 44777-2024 GB/T 43034.2-2024 GB/T 42968.2-2024 GB/T 20870.4-2024 GB 3438-1982 GB 3437-1982 GB 3433-1982 GB 6813-1986 GB 6814-1986 GB 6647-1986 GB 7504-1987 T/CIE 155-2023 GB/T 43454-2023 GB/T 43034.3-2023 |
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