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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage |
| Chinese Title: | 半导体器件 机械和气候试验方法 第42部分：温湿度贮存 |
| Standard No.: | GB/T 4937.42-2023 |
| Category No.: | L40 |
| Issued by: | SAMR; SAC |
| Issued on: | 2023-05-23 |
| Implemented on: | 2023-12-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 6000 words |
| Similar Standards: | GB/T 4937.16-2025 GB/T 46567.1-2025 GB/T 45722-2025 GB/T 45721.1-2025 GB/T 45718-2025 GB/T 45719-2025 GB/T 45716-2025 DB32/T 4894-2024 GB/T 4937.35-2024 GB/T 4937.34-2024 GB/T 4587-2023 GB/T 4937.26-2023 GB/T 42709.19-2023 GB/T 4937.27-2023 GB/T 4937.23-2023 GB/T 4937.32-2023 GB/T 4937.31-2023 GB/T 4937.42-2023 GB/T 42709.7-2023 GB/T 42706.2-2023 |
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