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| Chinese National Standard Category: Semiconductor integrated circuit |
| English Title: | Measuring methods of electrical properties for non-volatile phase change memory |
| Chinese Title: | 非易失性相变存储器电性能测试方法 |
| Standard No.: | T/CIE 155-2023 |
| Category No.: | L56 |
| Issued by: | CIE |
| Issued on: | 2023-03-20 |
| Implemented on: | |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 12500 words |
| Similar Standards: |
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