Standard No.:	T/CIE 155-2023
English Name:	Measuring methods of electrical properties for non-volatile phase change memory
Chinese Name:	非易失性相变存储器电性能测试方法
Chinese Classification:	L56    Semiconductor integrated circuit
Professional Classification:	T/    Social Organization Standard
Source Content Issued by:	CIE
Issued on:	2023-03-20
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	12500 words
Translation Price(USD):	375.0
Delivery:	via email in 1~5 business day

本文件规定了相变存储器件单元的电性能测试方法，分为器件性能测试和器件可靠性测试，器件性能测试包括电流-电压特性、存储窗口、置位时间、置位电压、复位时间、复位电压、功耗；器件可靠性测试包括耐久和数据保持时间。
本文件适用于相变存储器件单元。