| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| T/CIE 114-2021 |
|
|
|
valid,, |
|
| T/CIE 115-2021 |
General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components |
$255.00 |
via email in 1~3 business day |
valid,, |
|
| T/CIE 116-2021 |
Fault tree analysis method and procedure of electronic components |
$375.00 |
via email in 1~5 business day |
valid,, |
|
| T/CIE 117-2021 |
|
$165.00 |
via email in 1~3 business day |
valid,, |
|
| T/CIE 119-2021 |
Test method and procedure of atmospheric-neutron induced single event effects in semiconductor devices |
$225.00 |
via email in 1~3 business day |
valid,, |
|
| T/CIE 120-2021 |
|
$225.00 |
via email in 1~3 business day |
valid,, |
|
| T/CIE 121-2021 |
|
|
|
valid,, |
|
| T/CIE 129-2021 |
|
$555.00 |
via email in 1~5 business day |
valid,, |
|
| T/CIE 130-2022 |
|
$435.00 |
via email in 1~5 business day |
valid,, |
|
| T/CIE 131-2022 |
Information technology—General spatiotemporal information application support platform—Reference architecture |
$953.00 |
via email in 1~5 business day |
valid,,2022-5-30 |
|
| T/CIE 133-2022 |
|
|
|
valid,, |
|
| T/CIE 134-2022 |
|
|
|
valid,, |
|
| T/CIE 135-2022 |
|
|
|
valid,, |
|
| T/CIE 136-2022 |
|
|
|
valid,,2022-10-31 |
|
| T/CIE 137-2022 |
|
|
|
valid,,2023-1-1 |
|
| T/CIE 138-2022 |
|
|
|
valid,, |
|
| T/CIE 139-2022 |
|
|
|
valid,, |
|
| T/CIE 140-2022 |
|
|
|
valid,, |
|
| T/CIE 143-2022 |
Life evaluation method for key structures of complex component package |
$255.00 |
via email in 1~3 business day |
valid,, |
|
| T/CIE 144-2022 |
Reliability enhancement test of semiconductor devices |
$255.00 |
via email in 1~3 business day |
valid,, |
|
|
|
|
