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Position: Chinese Standard in English/T/CIE 115-2021
T/CIE 115-2021   General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components (English Version)
Standard No.: T/CIE 115-2021 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 8500 words Translation Price(USD):255.0 remind me the price change

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Implemented on: Delivery: via email in 1~3 business day

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Standard No.: T/CIE 115-2021
English Name: General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components
Chinese Name: 电子元器件失效机理、模式及影响分析(FMMEA)通用方法和程序
Chinese Classification: L04    Basic standards and general methods
Professional Classification: T/    Social Organization Standard
Issued on: 2021-11-22
Status: valid
Target Language: English
File Format: PDF
Word Count: 8500 words
Translation Price(USD): 255.0
Delivery: via email in 1~3 business day
本文件确立了对电子元器件进行失效机理、模式及其影响分析(FMMEA)的通用方法和程序。
本文件适用于电子元器件的风险等级分析。
Code of China
Standard
T/CIE 115-2021  General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components (English Version)
Standard No.T/CIE 115-2021
Statusvalid
LanguageEnglish
File FormatPDF
Word Count8500 words
Price(USD)255.0
Implemented on
Deliveryvia email in 1~3 business day
Detail of T/CIE 115-2021
Standard No.
T/CIE 115-2021
English Name
General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components
Chinese Name
电子元器件失效机理、模式及影响分析(FMMEA)通用方法和程序
Chinese Classification
L04
Professional Classification
T/
ICS Classification
Issued by
Issued on
2021-11-22
Implemented on
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
8500 words
Price(USD)
255.0
Keywords
T/CIE 115-2021, T/CIET 115-2021, TCIET 115-2021, T/CIE115-2021, T/CIE 115, T/CIE115, T/CIET115-2021, T/CIET 115, T/CIET115, TCIET115-2021, TCIET 115, TCIET115
Introduction of T/CIE 115-2021
本文件确立了对电子元器件进行失效机理、模式及其影响分析(FMMEA)的通用方法和程序。
本文件适用于电子元器件的风险等级分析。
Contents of T/CIE 115-2021
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Keywords:
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