| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB/T 1424-1996 |
of measurement of resistivity of precious metals and their alloys |
$75.00 |
via email in 1~3 business day |
valid,,1997-4-1 |
|
| GB/T 1425-1996 |
of melting temperature range for precious metals and their alloys - Testing method of thermal analysis |
$105.00 |
via email in 1~3 business day |
abolished2022-03-01,2022-3-1,1997-4-1 |
|
| GB/T 14453-1993 |
Metallic material－STANDARD test method for the elastic modulus at high temperature－The method of disc-Vibrator |
$120.00 |
via email in 1~3 business day |
superseded,2006-10-11,1994-1-1 |
|
| GB/T 1479-1984 |
Metallic powders--Determination of apparent density--Part 1: Funnel method |
$220.00 |
via email in 1~3 business day |
abolished2012-02-01 ,2012-2-1,1984-1-2 |
|
| GB/T 1482-1984 |
Metallic powders－Determination of flowability by means of a calibrated funnal (Hall flowmeter) |
$224.00 |
via email in 1~3 business day |
abolished2011-09-01,2011-9-1,1984-1-2 |
|
| GB/T 14847-1993 |
Test method for thickness of lightly doped silicon eqitaxial layers on heavily doped silicon substrates by infrared reflectance |
$300.00 |
via email in 1~3 business day |
superseded,2011-10-1,1994-9-1 |
|
| GB/T 15077-1994 |
Geometric size measuring methods of precious metals and their alloy materials |
$150.00 |
via email in 1~3 business day |
superseded,2008-9-1,1994-12-1 |
|
| GB/T 15078-1994 |
Measuring method for contact resistance of precious metal electrical contact materials |
$264.00 |
via email in 1~3 business day |
abolished2008-09-01,2008-9-1,1994-12-1 |
|
| GB/T 15078-2021 |
Testing method for contact resistance of precious metals electrical contact materials |
$165.00 |
via email in 1~3 business day |
valid,,2022-3-1 |
|
| GB/T 15250-1994 |
Test method for bulk acoustic wave attenuation of piezoelectric lithium niobate crystals |
$90.00 |
via email in 1~3 business day |
abolished2007-09-29,2006-10-11,1995-6-1 |
|
| GB/T 1550-1997 |
methods for measuring conductivity type of extrinsic semiconducting materials |
$120.00 |
via email in 1~3 business day |
superseded,2019-11-1,1997-1-2 |
|
| GB/T 1550-2018 |
Test methods for conductivity type of extrinsic semiconducting materials |
$225.00 |
immediately |
valid,,2019-11-1 |
|
| GB/T 1551-1995 |
Test method for resistivity of silicon and germanium bars using a two-point probe |
$450.00 |
via email in 1~3 business day |
superseded,2010-6-1,1995-1-2 |
|
| GB/T 1551-2021 |
Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method |
$375.00 |
immediately |
valid,,2021-12-1 |
|
| GB/T 1552-1995 |
Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array |
$240.00 |
via email in 1~3 business day |
superseded,2010-6-1,1995-1-2 |
|
| GB/T 1553-1997 |
Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay |
$240.00 |
via email in 1~3 business day |
abolished2010-06-01,2010-6-1,1997-1-2 |
|
| GB/T 1553-2023 |
Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method |
$465.00 |
via email in 1~5 business day |
valid,,2024-3-1 |
|
| GB/T 1555-1997 |
Test methods for determining the orientation of a semiconductor single crystal |
$300.00 |
via email in 1~3 business day |
superseded,2010-6-1,1998-8-1 |
|
| GB/T 1555-2023 |
Test methods for determining the orientation of a semiconductive single crystal |
$170.00 |
via email in 1~3 business day |
valid,,2024-3-1 |
|
| GB/T 1557-1989 |
The method of determining interstitial oxygen content in silicon by infrared absorption |
$224.00 |
via email in 1~3 business day |
superseded,2006-11-1,1990-2-1 |
|
* Related standard quantity: * Page quantity: *
Current: * First
Previous
[1][2][3][4][5][6][7][8][9][10][11]
Next
End
* Related standard quantity: * Page quantity: *
Current: * First
Previous
[1][2][3][4][5][6][7][8][9][10][11]
Next
End
|
