| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| JB/T 9400-2010 |
Specification of X-ray diffractometer |
$130.00 |
via email in 1~3 business day |
valid,,2010-7-1 |
|
| JB/T 9401-1999 |
X-Ray fluorescence analysing tube |
$380.00 |
via email in 1~3 business day |
abolished2010-01-20 ,,2000-1-1 |
|
| JY/T 001-1996 |
General rules for fourier transform infrared spectrometer |
$370.00 |
via email in 1~3 business day |
valid,,1997-4-1 |
|
| JY/T 011-1996 |
General rules for transmission electron microscopy |
$120.00 |
via email in 1~3 business day |
superseded,2020-12-1,1997-4-1 |
|
| JY/T 012-1996 |
General rules for metallographic microscopy |
$75.00 |
via email in 1~3 business day |
superseded,2020-12-1,1997-4-1 |
|
| T/COEMA 22O-2025 |
Photothermal-Lensing absorption measuring instrument (PLI) |
|
via email in business day |
valid,,2025-3-5 |
|
| ZB N 33003-1988 |
|
|
via email in business day |
superseded,2000-1-1,1989-7-1 |
|
| ZB N 33005-1988 |
|
$120.00 |
via email in 1~3 business day |
superseded,2000-1-1,1989-7-1 |
|
| ZB N 33008-1989 |
|
|
via email in business day |
superseded,2000-1-1,1990-1-1 |
|
| ZB N 33010-1989 |
|
|
via email in business day |
superseded,2000-1-1,1990-1-1 |
|
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