GB/T 23414-2009 English Version, GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary (English Version)

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GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary (English Version)
Standard No.:	GB/T 23414-2009	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	16000 words	Translation Price(USD):	450.0 remind me the price change Email:
Implemented on:	2009-12-1	Delivery:	via email in 1~5 business day

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Standard No.:	GB/T 23414-2009
English Name:	Microbeam analysis - Scanning electron microscopy - Vocabulary
Chinese Name:	微束分析扫描电子显微术术语
Chinese Classification:	N33 Electron optics and other physical optics instrument
Professional Classification:	GB National Standard
Source Content Issued by:	SAC
Issued on:	2009-04-01
Implemented on:	2009-12-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	16000 words
Translation Price(USD):	450.0
Delivery:	via email in 1~5 business day

Standard

GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary (English Version)
Standard No.	GB/T 23414-2009
Status	valid
Language	English
File Format	PDF
Word Count	16000 words
Price(USD)	450.0
Implemented on	2009-12-1
Delivery	via email in 1~5 business day

Detail of GB/T 23414-2009

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Introduction of GB/T 23414-2009

本标准定义了扫描电子显微术(SEM)实践中使用的术语。包括一般术语和按技术分类的具体概念的术语,也包括已经在ISO23833中定义的术语。
本标准适用于所有有关SEM 实践的标准化文件。另外,本标准的某些术语定义,也适用于相关领域的文件〔例如:电子探针显微分析(EPMA)、分析电子显微术(AEM)、能谱法(EDX)等〕。

Contents of GB/T 23414-2009

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