GB 11114-1989 English Version, GB 11114-1989 for detecting dislocations of synthetic quartz crystal using X-ray topographic technique (English Version)

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GB 11114-1989 for detecting dislocations of synthetic quartz crystal using X-ray topographic technique (English Version)
Standard No.:	GB 11114-1989	Status:	abolished remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	2000 words	Translation Price(USD):	60.0 remind me the price change Email:
Implemented on:	1990-3-1	Delivery:	via email in 1~3 business day

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Standard No.:	GB 11114-1989
English Name:	for detecting dislocations of synthetic quartz crystal using X-ray topographic technique
Chinese Name:	人造石英晶体位错X射线形貌检测方法
Chinese Classification:	L90 Special electronic technology material
Professional Classification:	GB National Standard
Source Content Issued by:	AQSIQ
Issued on:	1989-3-22
Implemented on:	1990-3-1
Status:	abolished
Abolished on:	2017-12-15
Superseding:	公告：国家标准公告2017年第31号
Target Language:	English
File Format:	PDF
Word Count:	2000 words
Translation Price(USD):	60.0
Delivery:	via email in 1~3 business day

Standard

GB 11114-1989 for detecting dislocations of synthetic quartz crystal using X-ray topographic technique (English Version)
Standard No.	GB 11114-1989
Status	abolished
Language	English
File Format	PDF
Word Count	2000 words
Price(USD)	60.0
Implemented on	1990-3-1
Delivery	via email in 1~3 business day

Detail of GB 11114-1989

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Introduction of GB 11114-1989

本标准规定了观测人造石英晶体的位错、划痕、层错、孪晶、沉淀物和生长条纹等缺陷和估算其位错密度的X射线衍射形貌方法。本标准适用于人造石英晶体及天然石英晶体位错密度等缺陷的检测。

Contents of GB 11114-1989

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Keywords:
GB 11114-1989, GB/T 11114-1989, GBT 11114-1989, GB11114-1989, GB 11114, GB11114, GB/T11114-1989, GB/T 11114, GB/T11114, GBT11114-1989, GBT 11114, GBT11114