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| Position: Chinese Standard in English/GB 3444-1982 |
| GB 3444-1982 General principles of measuring methods of bipolar random access memory for semiconductor integrated circuits (English Version) | |||
| Standard No.: | GB 3444-1982 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 15000 words | Translation Price(USD): | 1304.0 remind me the price change |
| Implemented on: | 1983-10-1 | Delivery: | via email in 1~5 business day |
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| Standard No.: | GB 3444-1982 |
| English Name: | General principles of measuring methods of bipolar random access memory for semiconductor integrated circuits |
| Chinese Name: | 半导体集成电路双极型随机存储器测试方法的基本原理 |
| Chinese Classification: | L56 Semiconductor integrated circuit |
| Professional Classification: | GB National Standard |
| Implemented on: | 1983-10-1 |
| Status: | superseded |
| Superseded by: | SJ/T 10740-1996 Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories |
| Superseded on: | 1997-1-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 15000 words |
| Translation Price(USD): | 1304.0 |
| Delivery: | via email in 1~5 business day |