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| Position: Chinese Standard in English/GB 5201-1985 |
| GB 5201-1985 Test procedures for semiconductor charged particle detectors (English Version) | |||
| Standard No.: | GB 5201-1985 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 4000 words | Translation Price(USD): | 340.0 remind me the price change |
| Implemented on: | Delivery: | via email in 1~3 business day | |
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| Standard No.: | GB 5201-1985 |
| English Name: | Test procedures for semiconductor charged particle detectors |
| Chinese Name: | 带电粒子半导体探测器测试方法 |
| Chinese Classification: | F81 General nuclear instrument |
| Professional Classification: | GB National Standard |
| Status: | superseded |
| Superseded by: | GB/T 5201-1994 Test procedures for semiconductor charged particle detectors |
| Superseded on: | 1995-10-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Translation Price(USD): | 340.0 |
| Delivery: | via email in 1~3 business day |