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Position: Chinese Standard in English/GB 5594.8-1985
GB 5594.8-1985   Test methods for properties of structure ceramic used in electronic components; Determination of microstructure (English Version)
Standard No.: GB 5594.8-1985 Status:superseded remind me the status change

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Target Language:English File Format:PDF
Word Count: 1000 words Translation Price(USD):30.0 remind me the price change

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Implemented on:1986-1-2 Delivery: via email in 1~3 business day

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2016-01-01 ,2016-1-1,1986-1-2,14113817375325A347342A040F42D
Standard No.: GB 5594.8-1985
English Name: Test methods for properties of structure ceramic used in electronic components; Determination of microstructure
Chinese Name: 电子元器件结构陶瓷材料性能测试方法 显微结构的测定
Chinese Classification: L32    
Professional Classification: GB    National Standard
Source Content Issued by: China State Bureau of Standards
Issued on: 1985-01-01
Implemented on: 1986-1-2
Status: superseded
Superseded by:GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device―Part 8:Test method for microstructure
Superseded on:2016-1-1
Abolished on:2016-01-01
Target Language: English
File Format: PDF
Word Count: 1000 words
Translation Price(USD): 30.0
Delivery: via email in 1~3 business day
本标准适用于氧化铝瓷、氧化铍瓷、滑石瓷和镁橄榄石瓷等电子元器件结构陶瓷显微结构的测定。
本标准只涉及光学显微镜的测定内容和测定方法。
Code of China
Standard
GB 5594.8-1985  Test methods for properties of structure ceramic used in electronic components; Determination of microstructure (English Version)
Standard No.GB 5594.8-1985
Statussuperseded
LanguageEnglish
File FormatPDF
Word Count1000 words
Price(USD)30.0
Implemented on1986-1-2
Deliveryvia email in 1~3 business day
Detail of GB 5594.8-1985
Standard No.
GB 5594.8-1985
English Name
Test methods for properties of structure ceramic used in electronic components; Determination of microstructure
Chinese Name
电子元器件结构陶瓷材料性能测试方法 显微结构的测定
Chinese Classification
L32
Professional Classification
GB
ICS Classification
Issued by
China State Bureau of Standards
Issued on
1985-01-01
Implemented on
1986-1-2
Status
superseded
Superseded by
GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device―Part 8:Test method for microstructure
Superseded on
2016-1-1
Abolished on
2016-01-01
Superseding
Language
English
File Format
PDF
Word Count
1000 words
Price(USD)
30.0
Keywords
GB 5594.8-1985, GB/T 5594.8-1985, GBT 5594.8-1985, GB5594.8-1985, GB 5594.8, GB5594.8, GB/T5594.8-1985, GB/T 5594.8, GB/T5594.8, GBT5594.8-1985, GBT 5594.8, GBT5594.8
Introduction of GB 5594.8-1985
本标准适用于氧化铝瓷、氧化铍瓷、滑石瓷和镁橄榄石瓷等电子元器件结构陶瓷显微结构的测定。
本标准只涉及光学显微镜的测定内容和测定方法。
Contents of GB 5594.8-1985
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Keywords:
GB 5594.8-1985, GB/T 5594.8-1985, GBT 5594.8-1985, GB5594.8-1985, GB 5594.8, GB5594.8, GB/T5594.8-1985, GB/T 5594.8, GB/T5594.8, GBT5594.8-1985, GBT 5594.8, GBT5594.8