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| Position: Chinese Standard in English/GB/T 11073-2007 |
| GB/T 11073-2007 Standard method for measuring radial resistivity variation on silicon slices (English Version) | |||
| Standard No.: | GB/T 11073-2007 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7000 words | Translation Price(USD): | 210.0 remind me the price change |
| Implemented on: | 2008-2-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 11073-2007 |
| English Name: | Standard method for measuring radial resistivity variation on silicon slices |
| Chinese Name: | 硅片径向电阻率变化的测量方法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.01 Testing of metals in general |
| Source Content Issued by: | AQSIQ;SAC |
| Issued on: | 2007-12-18 |
| Implemented on: | 2008-2-1 |
| Status: | superseded |
| Superseded by: | GB/T 11073-2025 Test method for measuring radial resistivity variation on silicon wafers |
| Superseded on: | 2026-5-1 |
| Superseding: | GB/T 11073-1989 Standard method for measuring radial resistivity variation on silicon slices |
| Target Language: | English |
| File Format: | |
| Word Count: | 7000 words |
| Translation Price(USD): | 210.0 |
| Delivery: | via email in 1~3 business day |