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| Position: Chinese Standard in English/GB/T 14140-2009 |
| GB/T 14140-2009 Test method for measuring diameter of semiconductor wafer (English Version) | |||
| Standard No.: | GB/T 14140-2009 | Status: | to be superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 6000 words | Translation Price(USD): | 180.0 remind me the price change |
| Implemented on: | 2010-6-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 14140-2009 |
| English Name: | Test method for measuring diameter of semiconductor wafer |
| Chinese Name: | 硅片直径测量方法 |
| Chinese Classification: | H82 Elemental semiconductor material |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Source Content Issued by: | AQSIQ; SAC |
| Issued on: | 2009-11-30 |
| Implemented on: | 2010-6-1 |
| Status: | to be superseded |
| Superseded by: | GB/T 14140-2025 Test method for measuring diameter of semiconductor wafer |
| Superseded on: | 2026-2-1 |
| Superseding: | GB/T 14140.2-1993 Silicon slices and wafers-Measuring of diameter-Micrometer method GB/T 14140.1-1993 Silicon slices and wafers--Measuring of diameter--Optical projecting method |
| Target Language: | English |
| File Format: | |
| Word Count: | 6000 words |
| Translation Price(USD): | 180.0 |
| Delivery: | via email in 1~3 business day |