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| Position: Chinese Standard in English/GB/T 1554-1995 |
| GB/T 1554-1995 Test method for crystallographic perfection of silicon by preferential etch techniques (English Version) | |||
| Standard No.: | GB/T 1554-1995 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5500 words | Translation Price(USD): | 410.0 remind me the price change |
| Implemented on: | 1995-12-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 1554-1995 |
| English Name: | Test method for crystallographic perfection of silicon by preferential etch techniques |
| Chinese Name: | 硅晶体完整性化学择优腐蚀检验方法 |
| Chinese Classification: | H26 Metal nondestructive testing method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.30 Chemical analysis of metals |
| Source Content Issued by: | SBTS |
| Issued on: | 1995-04-18 |
| Implemented on: | 1995-12-1 |
| Status: | superseded |
| Superseded by: | GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques |
| Superseded on: | 2010-6-1 |
| Superseding: | GB 1554-1979 GB 4057-1983 Singie crystal sllicon-Detection of microdefects-Chemical etching technique |
| Target Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Translation Price(USD): | 410.0 |
| Delivery: | via email in 1~3 business day |