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Position: Chinese Standard in English/GB/T 15651.3-2003
GB/T 15651.3-2003   Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods (English Version)
Standard No.: GB/T 15651.3-2003 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 12500 words Translation Price(USD):370.0 remind me the price change

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Implemented on:2004-8-1 Delivery: via email in 1~3 business day

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Standard No.: GB/T 15651.3-2003
English Name: Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Chinese Name: 半导体分立器件和集成电路 第5-3部分:光电子器件 测试方法
Chinese Classification: L50    Optoelectronic device assembly
Professional Classification: GB    National Standard
Source Content Issued by: AQSIQ
Issued on: 2003-1-1
Implemented on: 2004-8-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 12500 words
Translation Price(USD): 370.0
Delivery: via email in 1~3 business day
本部分适用于光电子器件的测试方法,用于光纤系统或子系统的除外。
Code of China
Standard
GB/T 15651.3-2003  Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods (English Version)
Standard No.GB/T 15651.3-2003
Statusvalid
LanguageEnglish
File FormatPDF
Word Count12500 words
Price(USD)370.0
Implemented on2004-8-1
Deliveryvia email in 1~3 business day
Detail of GB/T 15651.3-2003
Standard No.
GB/T 15651.3-2003
English Name
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Chinese Name
半导体分立器件和集成电路 第5-3部分:光电子器件 测试方法
Chinese Classification
L50
Professional Classification
GB
ICS Classification
Issued by
AQSIQ
Issued on
2003-1-1
Implemented on
2004-8-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
12500 words
Price(USD)
370.0
Keywords
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Introduction of GB/T 15651.3-2003
本部分适用于光电子器件的测试方法,用于光纤系统或子系统的除外。
Contents of GB/T 15651.3-2003
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