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Position: Chinese Standard in English/GB/T 17473.2-2008
GB/T 17473.2-2008   Test methods of presious metals pastes used for microelectronics - Determination of fineness (English Version)
Standard No.: GB/T 17473.2-2008 Status:superseded remind me the status change

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Target Language:English File Format:PDF
Word Count: 2000 words Translation Price(USD):60.0 remind me the price change

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Implemented on:2008-9-1 Delivery: via email in 1~3 business day

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2026-05-01,2026-5-1,2008-9-1,14113818185412B218E8FF3B298CC
Standard No.: GB/T 17473.2-2008
English Name: Test methods of presious metals pastes used for microelectronics - Determination of fineness
Chinese Name: 微电子技术用贵金属浆料测试方法 细度测定
Chinese Classification: H68    Precious metals and their alloys
Professional Classification: GB    National Standard
ICS Classification: 77.120.99 77.120.99    Other non-ferrous metals and their alloys 77.120.99
Source Content Issued by: AQSIQ; SAC
Issued on: 2008-3-31
Implemented on: 2008-9-1
Status: superseded
Superseded by:GB/T 17473-2025 Performance test method for electronic pastes— Conductor pastes test
Superseded on:2026-5-1
Abolished on:2026-05-01
Superseding:GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness
Target Language: English
File Format: PDF
Word Count: 2000 words
Translation Price(USD): 60.0
Delivery: via email in 1~3 business day
本部分规定了微电子技术用贵金属浆料细度的刮板测定方法。
本部分适用于微电子技术用贵金属浆料细度测定。
Code of China
Standard
GB/T 17473.2-2008  Test methods of presious metals pastes used for microelectronics - Determination of fineness (English Version)
Standard No.GB/T 17473.2-2008
Statussuperseded
LanguageEnglish
File FormatPDF
Word Count2000 words
Price(USD)60.0
Implemented on2008-9-1
Deliveryvia email in 1~3 business day
Detail of GB/T 17473.2-2008
Standard No.
GB/T 17473.2-2008
English Name
Test methods of presious metals pastes used for microelectronics - Determination of fineness
Chinese Name
微电子技术用贵金属浆料测试方法 细度测定
Chinese Classification
H68
Professional Classification
GB
ICS Classification
Issued by
AQSIQ; SAC
Issued on
2008-3-31
Implemented on
2008-9-1
Status
superseded
Superseded by
GB/T 17473-2025 Performance test method for electronic pastes— Conductor pastes test
Superseded on
2026-5-1
Abolished on
2026-05-01
Superseding
GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness
Language
English
File Format
PDF
Word Count
2000 words
Price(USD)
60.0
Keywords
GB/T 17473.2-2008, GB 17473.2-2008, GBT 17473.2-2008, GB/T17473.2-2008, GB/T 17473.2, GB/T17473.2, GB17473.2-2008, GB 17473.2, GB17473.2, GBT17473.2-2008, GBT 17473.2, GBT17473.2
Introduction of GB/T 17473.2-2008
本部分规定了微电子技术用贵金属浆料细度的刮板测定方法。
本部分适用于微电子技术用贵金属浆料细度测定。
Contents of GB/T 17473.2-2008
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Keywords:
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