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| Position: Chinese Standard in English/GB/T 24468-2025 |
| GB/T 24468-2025 Test method for semiconductor equipment reliability; availability and maintainability(RAM) (English Version) | |||
| Standard No.: | GB/T 24468-2025 | Status: | to be valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 19000 words | Translation Price(USD): | 570.0 remind me the price change |
| Implemented on: | 2026-5-1 | Delivery: | via email in 1~5 business day |
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| Standard No.: | GB/T 24468-2025 |
| English Name: | Test method for semiconductor equipment reliability; availability and maintainability(RAM) |
| Chinese Name: | 半导体设备可靠性、可用性和维修性（RAM）测量方法 |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | SAMR, SAC |
| Issued on: | 2025-10-05 |
| Implemented on: | 2026-5-1 |
| Status: | to be valid |
| Superseding: | GB/T 24468-2009 Specification for definition and measurement of semiconductor equipment reliability availability and maintainability(RAM) |
| Target Language: | English |
| File Format: | |
| Word Count: | 19000 words |
| Translation Price(USD): | 570.0 |
| Delivery: | via email in 1~5 business day |