Standard No.:	GB/T 24579-2009
English Name:	Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy
Chinese Name:	酸浸取 原子吸收光谱法测定多晶硅表面金属污染物
Chinese Classification:	H80    Semimetal and semiconductor material in general
Professional Classification:	GB    National Standard
ICS Classification:	29.045 29.045    Semiconducting materials 29.045
Source Content Issued by:	AQSIQ;SAC
Issued on:	2009-10-30
Implemented on:	2010-6-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	7000 words
Translation Price(USD):	210.0
Delivery:	via email in 1~3 business day

本标准规定了用酸从多晶硅块表面浸取金属杂质,并用石墨炉原子吸收定量检测多晶硅块表面上的痕量金属杂质分析方法。
本标准适用于碱金属、碱土金属和第一系列过渡元素如钠、铝、铁、铬、镍、锌的检测。
本标准适用于各种棒、块、粒、鋉片形多晶或单晶硅表面金属污染物的检测。由于块、片或粒形状不规则,面积很难准确测定,根据样品重量计算结果。