GB/T 30654-2014 English Version, GB/T 30654-2014 Test method for lattice constant of Ⅲ-nitride epitaxial layers (English Version)

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GB/T 30654-2014 Test method for lattice constant of Ⅲ-nitride epitaxial layers (English Version)
Standard No.:	GB/T 30654-2014	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	5500 words	Translation Price(USD):	150.0 remind me the price change Email:
Implemented on:	2015-9-1	Delivery:	via email in 1~3 business day

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Standard No.:	GB/T 30654-2014
English Name:	Test method for lattice constant of Ⅲ-nitride epitaxial layers
Chinese Name:	Ⅲ族氮化物外延片晶格常数测试方法
Chinese Classification:	H21 Metal physical property test method
Professional Classification:	GB National Standard
ICS Classification:	77.040.20 77.040.20 Non-destructive testing of metals 77.040.20
Source Content Issued by:	AQSIQ; SAC
Issued on:	2014-12-31
Implemented on:	2015-9-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	5500 words
Translation Price(USD):	150.0
Delivery:	via email in 1~3 business day

Standard

GB/T 30654-2014 Test method for lattice constant of Ⅲ-nitride epitaxial layers (English Version)
Standard No.	GB/T 30654-2014
Status	valid
Language	English
File Format	PDF
Word Count	5500 words
Price(USD)	150.0
Implemented on	2015-9-1
Delivery	via email in 1~3 business day

Detail of GB/T 30654-2014

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Introduction of GB/T 30654-2014

本标准规定了利用高分辨 X射线衍射测试Ⅲ族氮化物外延片晶格常数的方法。
本标准适用于在氧化物衬底(Al2O3、ZnO 等)或半导体衬底(GaN、Si、GaAs、SiC等)上外延生长的氮化物(Ga,In,Al)N 单层或多层异质外延片晶格常数的测量。其他异质外延片晶格常数的测量也可参考本标准。

Contents of GB/T 30654-2014

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