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Position: Chinese Standard in English/GB/T 31351-2014
GB/T 31351-2014   Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers (English Version)
Standard No.: GB/T 31351-2014 Status:to be superseded remind me the status change

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Target Language:English File Format:PDF
Word Count: 3500 words Translation Price(USD):100.0 remind me the price change

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Implemented on:2015-9-1 Delivery: via email in 1~3 business day

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,2026-2-1,2015-9-1,FD823476FE5891171432795262122
Standard No.: GB/T 31351-2014
English Name: Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers
Chinese Name: 碳化硅单晶抛光片微管密度无损检测方法
Chinese Classification: H26    Metal nondestructive testing method
Professional Classification: GB    National Standard
ICS Classification: 77.040.99 77.040.99    Other methods of testing of metals 77.040.99
Source Content Issued by: AQSIQ; SAC
Issued on: 2014-12-31
Implemented on: 2015-9-1
Status: to be superseded
Superseded by:GB/T 30868-2025
Superseded on:2026-2-1
Target Language: English
File Format: PDF
Word Count: 3500 words
Translation Price(USD): 100.0
Delivery: via email in 1~3 business day
本标准规定了4H晶型和6H晶型碳化硅单晶抛光片的微管密度的无损检测方法。
  
  本标准适用于4H晶型和6H晶型碳化硅单晶抛光片经单面抛光或双面抛光后、微管的径向尺寸在一微米至几十微米范围内的微管密度的测量。
Code of China
Standard
GB/T 31351-2014  Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers (English Version)
Standard No.GB/T 31351-2014
Statusto be superseded
LanguageEnglish
File FormatPDF
Word Count3500 words
Price(USD)100.0
Implemented on2015-9-1
Deliveryvia email in 1~3 business day
Detail of GB/T 31351-2014
Standard No.
GB/T 31351-2014
English Name
Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers
Chinese Name
碳化硅单晶抛光片微管密度无损检测方法
Chinese Classification
H26
Professional Classification
GB
ICS Classification
Issued by
AQSIQ; SAC
Issued on
2014-12-31
Implemented on
2015-9-1
Status
to be superseded
Superseded by
GB/T 30868-2025
Superseded on
2026-2-1
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
3500 words
Price(USD)
100.0
Keywords
GB/T 31351-2014, GB 31351-2014, GBT 31351-2014, GB/T31351-2014, GB/T 31351, GB/T31351, GB31351-2014, GB 31351, GB31351, GBT31351-2014, GBT 31351, GBT31351
Introduction of GB/T 31351-2014
本标准规定了4H晶型和6H晶型碳化硅单晶抛光片的微管密度的无损检测方法。
  
  本标准适用于4H晶型和6H晶型碳化硅单晶抛光片经单面抛光或双面抛光后、微管的径向尺寸在一微米至几十微米范围内的微管密度的测量。
Contents of GB/T 31351-2014
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Keywords:
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