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Position: Chinese Standard in English/GB/T 32188-2015
GB/T 32188-2015   The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate (English Version)
Standard No.: GB/T 32188-2015 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 5500 words Translation Price(USD):140.0 remind me the price change

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Implemented on:2016-11-1 Delivery: via email in 1~3 business day

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,,2016-11-1,1475120375972000ec1f2912d2b23fc8
Standard No.: GB/T 32188-2015
English Name: The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
Chinese Name: 氮化镓单晶衬底片x射线双晶摇摆曲线半高宽测试方法
Chinese Classification: H21    Metal physical property test method
Professional Classification: GB    National Standard
Source Content Issued by: AQSIQ; SAC
Issued on: 2015-12-10
Implemented on: 2016-11-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 5500 words
Translation Price(USD): 140.0
Delivery: via email in 1~3 business day
本标准规定了利用双晶 X射线衍射仪测试氮化镓单晶衬底片摇摆曲线半高宽的方法。
本标准适用于化学气相沉积及其他方法生长制备的氮化镓单晶衬底片。
Code of China
Standard
GB/T 32188-2015  The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate (English Version)
Standard No.GB/T 32188-2015
Statusvalid
LanguageEnglish
File FormatPDF
Word Count5500 words
Price(USD)140.0
Implemented on2016-11-1
Deliveryvia email in 1~3 business day
Detail of GB/T 32188-2015
Standard No.
GB/T 32188-2015
English Name
The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
Chinese Name
氮化镓单晶衬底片x射线双晶摇摆曲线半高宽测试方法
Chinese Classification
H21
Professional Classification
GB
ICS Classification
Issued by
AQSIQ; SAC
Issued on
2015-12-10
Implemented on
2016-11-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
5500 words
Price(USD)
140.0
Keywords
GB/T 32188-2015, GB 32188-2015, GBT 32188-2015, GB/T32188-2015, GB/T 32188, GB/T32188, GB32188-2015, GB 32188, GB32188, GBT32188-2015, GBT 32188, GBT32188
Introduction of GB/T 32188-2015
本标准规定了利用双晶 X射线衍射仪测试氮化镓单晶衬底片摇摆曲线半高宽的方法。
本标准适用于化学气相沉积及其他方法生长制备的氮化镓单晶衬底片。
Contents of GB/T 32188-2015
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Keywords:
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