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| Position: Chinese Standard in English/GB/T 32280-2015 |
| GB/T 32280-2015 Test method for warp of silicon wafers—Automated non-contact scanning method (English Version) | |||
| Standard No.: | GB/T 32280-2015 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 8000 words | Translation Price(USD): | 200.0 remind me the price change |
| Implemented on: | 2017-1-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 32280-2015 |
| English Name: | Test method for warp of silicon wafers—Automated non-contact scanning method |
| Chinese Name: | 硅片翘曲度测试 自动非接触扫描法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | AQSIQ;SAC |
| Issued on: | 2015-12-10 |
| Implemented on: | 2017-1-1 |
| Status: | superseded |
| Superseded by: | GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method |
| Superseded on: | 2022-10-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 8000 words |
| Translation Price(USD): | 200.0 |
| Delivery: | via email in 1~3 business day |