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Position: Chinese Standard in English/GB/T 35309-2017
GB/T 35309-2017   Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies (English Version)
Standard No.: GB/T 35309-2017 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 5500 words Translation Price(USD):160.0 remind me the price change

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Implemented on:2018-7-1 Delivery: via email in 1~3 business day

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Standard No.: GB/T 35309-2017
English Name: Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies
Chinese Name: 用区熔法和光谱分析法评价颗粒状多晶硅的规程
Chinese Classification: H17    Semimetal and semiconductor material analysis method
Professional Classification: GB    National Standard
Source Content Issued by: AQSIQ; SAC
Issued on: 2017-12-29
Implemented on: 2018-7-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 5500 words
Translation Price(USD): 160.0
Delivery: via email in 1~3 business day
本标准规定了用区熔法和光谱分析法评价颗粒状多晶硅的代位碳原子浓度、施主杂质浓度和受主杂质浓度的方法。
本标准适用于尺寸在600μm~3000μm的颗粒状多晶硅,其他尺寸的颗粒状多晶硅可参照本标准执行。
Code of China
Standard
GB/T 35309-2017  Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies (English Version)
Standard No.GB/T 35309-2017
Statusvalid
LanguageEnglish
File FormatPDF
Word Count5500 words
Price(USD)160.0
Implemented on2018-7-1
Deliveryvia email in 1~3 business day
Detail of GB/T 35309-2017
Standard No.
GB/T 35309-2017
English Name
Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies
Chinese Name
用区熔法和光谱分析法评价颗粒状多晶硅的规程
Chinese Classification
H17
Professional Classification
GB
ICS Classification
Issued by
AQSIQ; SAC
Issued on
2017-12-29
Implemented on
2018-7-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
5500 words
Price(USD)
160.0
Keywords
GB/T 35309-2017, GB 35309-2017, GBT 35309-2017, GB/T35309-2017, GB/T 35309, GB/T35309, GB35309-2017, GB 35309, GB35309, GBT35309-2017, GBT 35309, GBT35309
Introduction of GB/T 35309-2017
本标准规定了用区熔法和光谱分析法评价颗粒状多晶硅的代位碳原子浓度、施主杂质浓度和受主杂质浓度的方法。
本标准适用于尺寸在600μm~3000μm的颗粒状多晶硅,其他尺寸的颗粒状多晶硅可参照本标准执行。
Contents of GB/T 35309-2017
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