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Standard
| GB/T 36474-2018 Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM) (English Version) |
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Detail of GB/T 36474-2018
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Introduction of GB/T 36474-2018
本标准规定了半导体集成电路第三代双倍数据速率同步动态随机存储器(DDR3 SDRAM)功能验证和电参数测试的方法。
本标准适用于半导体集成电路领域中第三代双倍数据速率同步动态随机存储器(DDR3 SDRAM)功能验证和电参数测试。
Contents of GB/T 36474-2018