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| Position: Chinese Standard in English/GB/T 39145-2020 |
| GB/T 39145-2020 Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry (English Version) | |||
| Standard No.: | GB/T 39145-2020 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5500 words | Translation Price(USD): | 165.0 remind me the price change |
| Implemented on: | 2021-9-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 39145-2020 |
| English Name: | Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry |
| Chinese Name: | 硅片表面金属元素含量的测定 电感耦合等离子体质谱法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | SAMR; SAC |
| Issued on: | 2020-10-11 |
| Implemented on: | 2021-9-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Translation Price(USD): | 165.0 |
| Delivery: | via email in 1~3 business day |