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Position: Chinese Standard in English/GB/T 42263-2022
GB/T 42263-2022   Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method (English Version)
Standard No.: GB/T 42263-2022 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 5500 words Translation Price(USD):165.0 remind me the price change

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Implemented on:2023-4-1 Delivery: via email in 1~3 business day

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Standard No.: GB/T 42263-2022
English Name: Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
Chinese Name: 硅单晶中氮含量的测定 二次离子质谱法
Chinese Classification: H17    Semimetal and semiconductor material analysis method
Professional Classification: GB    National Standard
Source Content Issued by: SAMR; SAC
Issued on: 2022-12-30
Implemented on: 2023-4-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 5500 words
Translation Price(USD): 165.0
Delivery: via email in 1~3 business day
本文件描述了硅单晶中氮含量的二次离子质谱测试方法。本文件适用于硼、锑、砷、磷的掺杂浓度小于1×10??20? cm??-3?(0.2%)的硅单晶中氮含量的测定,测定范围不小于1×10??14? cm??-3?。注: 硅单晶中氮含量以每立方厘米中的原子数计。
Code of China
Standard
GB/T 42263-2022  Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method (English Version)
Standard No.GB/T 42263-2022
Statusvalid
LanguageEnglish
File FormatPDF
Word Count5500 words
Price(USD)165.0
Implemented on2023-4-1
Deliveryvia email in 1~3 business day
Detail of GB/T 42263-2022
Standard No.
GB/T 42263-2022
English Name
Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
Chinese Name
硅单晶中氮含量的测定 二次离子质谱法
Chinese Classification
H17
Professional Classification
GB
ICS Classification
Issued by
SAMR; SAC
Issued on
2022-12-30
Implemented on
2023-4-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
5500 words
Price(USD)
165.0
Keywords
GB/T 42263-2022, GB 42263-2022, GBT 42263-2022, GB/T42263-2022, GB/T 42263, GB/T42263, GB42263-2022, GB 42263, GB42263, GBT42263-2022, GBT 42263, GBT42263
Introduction of GB/T 42263-2022
本文件描述了硅单晶中氮含量的二次离子质谱测试方法。本文件适用于硼、锑、砷、磷的掺杂浓度小于1×10??20? cm??-3?(0.2%)的硅单晶中氮含量的测定,测定范围不小于1×10??14? cm??-3?。注: 硅单晶中氮含量以每立方厘米中的原子数计。
Contents of GB/T 42263-2022
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Keywords:
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