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Position: Chinese Standard in English/GB/T 42905-2023
GB/T 42905-2023   Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method (English Version)
Standard No.: GB/T 42905-2023 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 5500 words Translation Price(USD):165.0 remind me the price change

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Implemented on:2024-3-1 Delivery: via email in 1~3 business day

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Standard No.: GB/T 42905-2023
English Name: Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method
Chinese Name: 碳化硅外延层厚度的测试 红外反射法
Chinese Classification: H21    Metal physical property test method
Professional Classification: GB    National Standard
Source Content Issued by: SAMR; SAC
Issued on: 2023-08-06
Implemented on: 2024-3-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 5500 words
Translation Price(USD): 165.0
Delivery: via email in 1~3 business day
本文件描述了采用红外反射法测试碳化硅外延层厚度的方法。
本文件适用于n型掺杂浓度大于1×1018 cm-3的碳化硅衬底上同质掺杂浓度小于1×1016 cm-3的同质碳化硅外延层厚度的测试,测试范围为3 μm~200 μm。
Code of China
Standard
GB/T 42905-2023  Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method (English Version)
Standard No.GB/T 42905-2023
Statusvalid
LanguageEnglish
File FormatPDF
Word Count5500 words
Price(USD)165.0
Implemented on2024-3-1
Deliveryvia email in 1~3 business day
Detail of GB/T 42905-2023
Standard No.
GB/T 42905-2023
English Name
Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method
Chinese Name
碳化硅外延层厚度的测试 红外反射法
Chinese Classification
H21
Professional Classification
GB
ICS Classification
Issued by
SAMR; SAC
Issued on
2023-08-06
Implemented on
2024-3-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
5500 words
Price(USD)
165.0
Keywords
GB/T 42905-2023, GB 42905-2023, GBT 42905-2023, GB/T42905-2023, GB/T 42905, GB/T42905, GB42905-2023, GB 42905, GB42905, GBT42905-2023, GBT 42905, GBT42905
Introduction of GB/T 42905-2023
本文件描述了采用红外反射法测试碳化硅外延层厚度的方法。
本文件适用于n型掺杂浓度大于1×1018 cm-3的碳化硅衬底上同质掺杂浓度小于1×1016 cm-3的同质碳化硅外延层厚度的测试,测试范围为3 μm~200 μm。
Contents of GB/T 42905-2023
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Keywords:
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