GB/T 42968.2-2024 English Version, GB/T 42968.2-2024 Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method (English Version)

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GB/T 42968.2-2024 Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method (English Version)
Standard No.:	GB/T 42968.2-2024	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	14500 words	Translation Price(USD):	435.0 remind me the price change Email:
Implemented on:	2024-10-26	Delivery:	via email in 1~5 business day

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Standard No.:	GB/T 42968.2-2024
English Name:	Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method
Chinese Name:	集成电路电磁抗扰度测量第2部分：辐射抗扰度测量 TEM小室和宽带TEM小室法
Chinese Classification:	L56 Semiconductor integrated circuit
Professional Classification:	GB National Standard
Source Content Issued by:	SAMR; SAC
Issued on:	2024-10-26
Implemented on:	2024-10-26
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	14500 words
Translation Price(USD):	435.0
Delivery:	via email in 1~5 business day

Standard

GB/T 42968.2-2024 Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method (English Version)
Standard No.	GB/T 42968.2-2024
Status	valid
Language	English
File Format	PDF
Word Count	14500 words
Price(USD)	435.0
Implemented on	2024-10-26
Delivery	via email in 1~5 business day

Detail of GB/T 42968.2-2024

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Introduction of GB/T 42968.2-2024

本文件描述了集成电路（IC）对射频（RF）辐射电磁骚扰的抗扰度测量方法。本文件适用的频率范围为150 kHz～1 GHz或为TEM小室和宽带TEM小室的特性决定的频率范围。

Contents of GB/T 42968.2-2024

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Keywords:
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