Standard No.:	GB/T 4326-1984
English Name:	Extrinsic semiconductor single crystals; Measurement of Hall mobility and Hall coefficient
Chinese Name:	非本征半导体单晶霍尔迁移率和霍尔系数测量方法
Chinese Classification:	H21    Metal physical property test method
Professional Classification:	GB    National Standard
Source Content Issued by:	China State Bureau of Standards
Issued on:	1984-04-12
Implemented on:	1985-3-1
Status:	superseded
Superseded by:	GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
Superseded on:	2006-11-1
Abolished on:	2006-11-01
Target Language:	English
File Format:	PDF
Word Count:	5000 words
Translation Price(USD):	150.0
Delivery:	via email in 1~3 business day

本标准适用于在非本征半导体单晶试样中确定载流子霍尔迁移率。为获得霍尔迁移率必须测量电阻率和霍尔系数，因此本标准也分别适用于这些参数的测量。本方法仅在有限的范围内和对锗、硅和砷化镓进行了实验室测量，但该方法也可适用于其他半导体单晶材料。所述的测量技术至少适用于室温电阻率高达104Ωcm的试样。