Standard No.:	GB/T 45772-2025
English Name:	Surface chemical analysis—Electron spectroscopies—Procedures for identifying; estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
Chinese Name:	表面化学分析 电子能谱 X射线光电子能谱分析中X射线致材料非预期损伤的识别、评估和校正程序
Chinese Classification:	G04    Basic standards and general methods
Professional Classification:	GB    National Standard
ICS Classification:	71.040.40 71.040.40    Chemical analysis 71.040.40
Source Content Issued by:	SAMR; SAC
Issued on:	2025-06-30
Implemented on:	2026-1-1
Status:	to be valid
Target Language:	English
File Format:	PDF
Word Count:	12500 words
Translation Price(USD):	375.0
Delivery:	via email in 1~5 business day

本文件规定了X射线光电子能谱(XPS)分析中，由X射线辐照导致试样元素组成或化学态的非预期性损伤的识别、评估和校正方法的要求。
本文件仅适用于X射线引起的非预期性损伤，导致光电子谱峰强度的降低或增加小于30%。本文件不涉及不同类型材料之间的比较，也不涉及发生损伤的机制、深度或化学性质。