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| Position: Chinese Standard in English/GB/T 4937.18-2018 |
| GB/T 4937.18-2018 Semiconductor devices—Mechanical and climatic test methods—Part 18:Ionizing radiation(total dose) (English Version) | |||
| Standard No.: | GB/T 4937.18-2018 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5500 words | Translation Price(USD): | 130.0 remind me the price change |
| Implemented on: | 2019-1-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 4937.18-2018 |
| English Name: | Semiconductor devices—Mechanical and climatic test methods—Part 18:Ionizing radiation(total dose) |
| Chinese Name: | 半导体器件 机械和气候试验方法 第18部分：电离辐照(总剂量) |
| Chinese Classification: | L40 Semiconductor discrete devices in general |
| Professional Classification: | GB National Standard |
| ICS Classification: | 31.080.01 Semiconductor devices in general |
| Source Content Issued by: | SAMR; SAC |
| Issued on: | 2018-09-17 |
| Implemented on: | 2019-1-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Translation Price(USD): | 130.0 |
| Delivery: | via email in 1~3 business day |