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| Position: Chinese Standard in English/GB/T 8759-1988 |
| GB/T 8759-1988 Compound semiconductive single crystals--Determination of crzystallographic orientation--X-ray diffraction method (English Version) | |||
| Standard No.: | GB/T 8759-1988 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | Translation Price(USD): | remind me the price change | |
| Implemented on: | 1989-7-1 | Delivery: | |
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| Standard No.: | GB/T 8759-1988 |
| English Name: | Compound semiconductive single crystals--Determination of crzystallographic orientation--X-ray diffraction method |
| Chinese Name: | 化合物半导体单晶晶向X射线衍射测量方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Implemented on: | 1989-7-1 |
| Status: | superseded |
| Superseded by: | GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal |
| Superseded on: | 1998-8-1 |
| Abolished on: | 1998-08-01 |
| Target Language: | English |
| File Format: |