GB/Z 42023.1-2023 Reliability of industrial automation devices and systems—Part 1: Assurance of automation devices reliability data and specification of their source (English Version)
GB/Z 42023.1-2023 Reliability of industrial automation devices and systems - Part 1: Assurance of automation devices reliability data and specification of their source
1 Scope
This document provides guidance on the assurance of reliability data of automation devices. If the source of this data is calculation, guidance is given on how to specify the methods used for this calculation. If the source is from observation of devices in the field, guidance is given on how to describe these observations and their evaluations. If the source is the outcome of laboratory tests, guidance is given on how to specify these tests and the conditions under which they have been carried out.
This document defines the form to present the data.
The components considered in this document are assumed not to need any break-in phase before full range usage.
When devices are used for functional safety application, the requirements of IEC 61508 (all parts) and related standards are considered.
2 Normative references
The following documents are referenced in the text in such a way that some or all of their content constitutes requirements for this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 5080.1-2012 Reliability testing - Part 1: Test conditions and statistical test principles (IEC 60300-3-5:2001, IDT)
GB/T 34987-2017 Weibull analysis ( IEC 61649:2008, IDT)
IEC 60300-3-2:2004 Dependability management - Part 3-2: Application guide - Collection of dependability data from the field
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1.1
assurance of reliability data
outcome of having the needed supporting information such that the reliability data can be trusted, verified and audited
3.1.2
B10 threshold
time until 10 % of the components fail
Note 1: The applicable time interval is dependent on the nature and application of the asset and can be elapsed time, operating hours, number of cycles, etc.
Note 2: For this document, an average failure rate is calculated from the B10 threshold by dividing 10 % with the B10 threshold in hours. The influence of infant mortality is neglected and increasing failure rate is assumed only significant after B10.
Note 3: Once the B10 threshold is reached, the failure rate is assumed unacceptable for pneumatic and electromechanical components.
3.1.3
burn-in
process conducted with the sole intention of stabilizing parameters
Note: Burn-in is an accelerated conditioning by operating the item under its operating electrical load at an elevated temperature, which is generally the maximum operating temperature that does not exceed the thermal rating of the device.
3.1.4
failure rate
λ
limit, if it exists, of the quotient of the conditional probability that the failure of a non-repairable item occurs within time interval (t, t + Δt) by Δt, when Δt tends to zero, given that failure has not occurred within time interval (0, t)
Note: For more detail, see IEC 61703.
[SOURCE: GB/T 2900.99-2016, 192-05-06, modified]
3.1.5
failure in time
FIT
the number of failures in 109 component hours of operation
[SOURCE: GB/T 14048.13-2017, 2.2.18]
3.1.6
field data
reliability data observed in the field
Note: The word “field” means the normal working environment of the device.
3.1.7
mean operating time between failures
MTBF
expectation of the duration of the operating time between failures
Note: Mean operating time between failures should only be applied to repairable items. For non-repairable items, see mean operating time to failure (3.1.8).
[SOURCE: GB/T 2900.99-2016, 192-05-13, modified]
3.1.8
mean operating time to failure
MTTF
expectation of the operating time to failure
Note: In the case of non-repairable items with an exponential distribution of operating times to failure (i.e. a constant failure rate) the MTTF is numerically equal to the reciprocal of the failure rate. This is also true for repairable items if after restoration they can be considered to be "as-good-as-new".
[SOURCE: GB/T 2099.99-2016, 192-05-11, modified]
3.1.9
mission time
TM
period of time covering the intended use
Note: For complex systems with component maintenance, the system mission time is longer than the mission time of a single component of the system.
[SOURCE: GB/T 16855.1-2018, 3.1.28, modified]
3.1.10
random hardware failure
failure, occurring at a random time, which results from one or more of the possible degradation mechanisms in the hardware
[SOURCE: GB/T 20438.4-2017, 3.6.5, modified]
3.1.11
reliability
ability to perform as required, without failure, for a given time interval, under given conditions
Note 1: The time interval duration can be expressed in units appropriate to the item concerned, e.g. calendar time, operating cycles, distance run, etc., and the units should always be clearly stated.
Note 2: Given conditions include aspects that affect reliability, such as: mode of operation, stress levels, environmental conditions, and maintenance.
[SOURCE: GB/T 2900.99-2016, 192-01-24, modified]
3.1.12
systematic failure
failure, related in a deterministic way to a certain cause, which can only be eliminated by a modification of the design or of the manufacturing process, operational procedures, documentation or other relevant factors
Note 1: Corrective maintenance without modification will usually not eliminate the failure cause.
Note 2: A systematic failure can be induced by simulating the failure cause.
Note 3: Examples of causes of systematic failures include human error in
——the safety requirements specification;
——the design, manufacture, installation, operation of the hardware;
——the design, implementation, etc. of the software.
Note 4: In this standard, failures in a safety-related system are categorized as random hardware failures (see 3.1.10) or systematic failures.
[SOURCE: GB/T 20438.4-2017, 3.6.6]
3.1.13
useful life
time interval, from first use until user requirements are no longer met, due to economics of operation and maintenance, or obsolescence
Note: In this context, “first use” excludes testing activities prior to hand-over of the item to the end-user.
[SOURCE: GB/T 2900.99-2016, 192-02-27, modified]
3.2 Abbreviated terms
For the purposes of this document, the following abbreviated terms apply.
FIT: Failures in time
MTBF: Mean time between failures
MTTF: Mean time to failure
TM: Mission time
4 Form to present reliability data
Generally, the reliability data can be considered from the following aspects.
——Source of data: how to get the reliability data, from calculation/observation of devices in the field/ laboratory test, standards or database.
——Reliability data: Common reliability data such as MTBF, λ, MTTF, and B10.
——Period of validity, such as TM.
——Reference conditions: Information about deployment conditions under which a device was observed or which are assumed for its future deployment, such as operating time, exposure time, operating voltage, operating current, duty cycle.
Standard
GB/Z 42023.1-2023 Reliability of industrial automation devices and systems—Part 1: Assurance of automation devices reliability data and specification of their source (English Version)
Standard No.
GB/Z 42023.1-2023
Status
valid
Language
English
File Format
PDF
Word Count
12000 words
Price(USD)
360.0
Implemented on
2024-6-1
Delivery
via email in 1~3 business day
Detail of GB/Z 42023.1-2023
Standard No.
GB/Z 42023.1-2023
English Name
Reliability of industrial automation devices and systems—Part 1: Assurance of automation devices reliability data and specification of their source
GB/Z 42023.1-2023 Reliability of industrial automation devices and systems - Part 1: Assurance of automation devices reliability data and specification of their source
1 Scope
This document provides guidance on the assurance of reliability data of automation devices. If the source of this data is calculation, guidance is given on how to specify the methods used for this calculation. If the source is from observation of devices in the field, guidance is given on how to describe these observations and their evaluations. If the source is the outcome of laboratory tests, guidance is given on how to specify these tests and the conditions under which they have been carried out.
This document defines the form to present the data.
The components considered in this document are assumed not to need any break-in phase before full range usage.
When devices are used for functional safety application, the requirements of IEC 61508 (all parts) and related standards are considered.
2 Normative references
The following documents are referenced in the text in such a way that some or all of their content constitutes requirements for this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 5080.1-2012 Reliability testing - Part 1: Test conditions and statistical test principles (IEC 60300-3-5:2001, IDT)
GB/T 34987-2017 Weibull analysis ( IEC 61649:2008, IDT)
IEC 60300-3-2:2004 Dependability management - Part 3-2: Application guide - Collection of dependability data from the field
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1.1
assurance of reliability data
outcome of having the needed supporting information such that the reliability data can be trusted, verified and audited
3.1.2
B10 threshold
time until 10 % of the components fail
Note 1: The applicable time interval is dependent on the nature and application of the asset and can be elapsed time, operating hours, number of cycles, etc.
Note 2: For this document, an average failure rate is calculated from the B10 threshold by dividing 10 % with the B10 threshold in hours. The influence of infant mortality is neglected and increasing failure rate is assumed only significant after B10.
Note 3: Once the B10 threshold is reached, the failure rate is assumed unacceptable for pneumatic and electromechanical components.
3.1.3
burn-in
process conducted with the sole intention of stabilizing parameters
Note: Burn-in is an accelerated conditioning by operating the item under its operating electrical load at an elevated temperature, which is generally the maximum operating temperature that does not exceed the thermal rating of the device.
3.1.4
failure rate
λ
limit, if it exists, of the quotient of the conditional probability that the failure of a non-repairable item occurs within time interval (t, t + Δt) by Δt, when Δt tends to zero, given that failure has not occurred within time interval (0, t)
Note: For more detail, see IEC 61703.
[SOURCE: GB/T 2900.99-2016, 192-05-06, modified]
3.1.5
failure in time
FIT
the number of failures in 109 component hours of operation
[SOURCE: GB/T 14048.13-2017, 2.2.18]
3.1.6
field data
reliability data observed in the field
Note: The word “field” means the normal working environment of the device.
3.1.7
mean operating time between failures
MTBF
expectation of the duration of the operating time between failures
Note: Mean operating time between failures should only be applied to repairable items. For non-repairable items, see mean operating time to failure (3.1.8).
[SOURCE: GB/T 2900.99-2016, 192-05-13, modified]
3.1.8
mean operating time to failure
MTTF
expectation of the operating time to failure
Note: In the case of non-repairable items with an exponential distribution of operating times to failure (i.e. a constant failure rate) the MTTF is numerically equal to the reciprocal of the failure rate. This is also true for repairable items if after restoration they can be considered to be "as-good-as-new".
[SOURCE: GB/T 2099.99-2016, 192-05-11, modified]
3.1.9
mission time
TM
period of time covering the intended use
Note: For complex systems with component maintenance, the system mission time is longer than the mission time of a single component of the system.
[SOURCE: GB/T 16855.1-2018, 3.1.28, modified]
3.1.10
random hardware failure
failure, occurring at a random time, which results from one or more of the possible degradation mechanisms in the hardware
[SOURCE: GB/T 20438.4-2017, 3.6.5, modified]
3.1.11
reliability
ability to perform as required, without failure, for a given time interval, under given conditions
Note 1: The time interval duration can be expressed in units appropriate to the item concerned, e.g. calendar time, operating cycles, distance run, etc., and the units should always be clearly stated.
Note 2: Given conditions include aspects that affect reliability, such as: mode of operation, stress levels, environmental conditions, and maintenance.
[SOURCE: GB/T 2900.99-2016, 192-01-24, modified]
3.1.12
systematic failure
failure, related in a deterministic way to a certain cause, which can only be eliminated by a modification of the design or of the manufacturing process, operational procedures, documentation or other relevant factors
Note 1: Corrective maintenance without modification will usually not eliminate the failure cause.
Note 2: A systematic failure can be induced by simulating the failure cause.
Note 3: Examples of causes of systematic failures include human error in
——the safety requirements specification;
——the design, manufacture, installation, operation of the hardware;
——the design, implementation, etc. of the software.
Note 4: In this standard, failures in a safety-related system are categorized as random hardware failures (see 3.1.10) or systematic failures.
[SOURCE: GB/T 20438.4-2017, 3.6.6]
3.1.13
useful life
time interval, from first use until user requirements are no longer met, due to economics of operation and maintenance, or obsolescence
Note: In this context, “first use” excludes testing activities prior to hand-over of the item to the end-user.
[SOURCE: GB/T 2900.99-2016, 192-02-27, modified]
3.2 Abbreviated terms
For the purposes of this document, the following abbreviated terms apply.
FIT: Failures in time
MTBF: Mean time between failures
MTTF: Mean time to failure
TM: Mission time
4 Form to present reliability data
Generally, the reliability data can be considered from the following aspects.
——Source of data: how to get the reliability data, from calculation/observation of devices in the field/ laboratory test, standards or database.
——Reliability data: Common reliability data such as MTBF, λ, MTTF, and B10.
——Period of validity, such as TM.
——Reference conditions: Information about deployment conditions under which a device was observed or which are assumed for its future deployment, such as operating time, exposure time, operating voltage, operating current, duty cycle.
