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| Position: Chinese Standard in English/JB/T 5580-1991 |
| JB/T 5580-1991 Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instruments (English Version) | |||
| Standard No.: | JB/T 5580-1991 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 3500 words | Translation Price(USD): | 300.0 remind me the price change |
| Implemented on: | 1992-7-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | JB/T 5580-1991 |
| English Name: | Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instruments |
| Chinese Name: | 半导体集成电路 机电仪专用数字电路测试方法 |
| Chinese Classification: | L56 Semiconductor integrated circuit |
| Professional Classification: | JB Professional Standard - Machinery |
| Source Content Issued by: | Beijing Research Institute of Automation for Machine-Building Industry |
| Issued on: | 1991-07-16 |
| Implemented on: | 1992-7-1 |
| Status: | abolished |
| Abolished on: | 2010-01-20 |
| Superseding: | ZB N23001-1988 |
| Target Language: | English |
| File Format: | |
| Word Count: | 3500 words |
| Translation Price(USD): | 300.0 |
| Delivery: | via email in 1~3 business day |