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Position: Chinese Standard in English/JJG 508-2004
JJG 508-2004   Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method (English Version)
Standard No.: JJG 508-2004 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 9000 words Translation Price(USD):270.0 remind me the price change

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Implemented on:2005-3-1 Delivery: via email in 1~3 business day

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,,2005-3-1,14113744575126A3001A176FF8473
Standard No.: JJG 508-2004
English Name: Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
Chinese Name: 四探针电阻率测试仪检定规程
Chinese Classification: A56    Radio Measurement
Professional Classification: JJ    Metering
Source Content Issued by: AQSIQ
Issued on: 2004-9-21
Implemented on: 2005-3-1
Status: valid
Superseding:JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
Target Language: English
File Format: PDF
Word Count: 9000 words
Translation Price(USD): 270.0
Delivery: via email in 1~3 business day
本规程适用于接触式,测量范围在10-3Ω?㎝—10 3Ω?㎝的四探针电阻率测试仪的首次检定,后续检定的和使用中检验。对某些多功能的四探针电阻率测试仪或只能测量方块电阻四探针测试仪也同样适用。方块电阻的测量范围在10-2Ω/□—10 2Ω/□。
本规程不适用于二探针、三探针、六探针及方型四探针电阻率测试仪的检定。
Code of China
Standard
JJG 508-2004   Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method (English Version)
Standard No.JJG 508-2004
Statusvalid
LanguageEnglish
File FormatPDF
Word Count9000 words
Price(USD)270.0
Implemented on2005-3-1
Deliveryvia email in 1~3 business day
Detail of JJG 508-2004
Standard No.
JJG 508-2004
English Name
Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
Chinese Name
四探针电阻率测试仪检定规程
Chinese Classification
A56
Professional Classification
JJ
ICS Classification
Issued by
AQSIQ
Issued on
2004-9-21
Implemented on
2005-3-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
Language
English
File Format
PDF
Word Count
9000 words
Price(USD)
270.0
Keywords
JJG 508-2004, JJG/T 508-2004, JJGT 508-2004, JJG508-2004, JJG 508, JJG508, JJG/T508-2004, JJG/T 508, JJG/T508, JJGT508-2004, JJGT 508, JJGT508
Introduction of JJG 508-2004
本规程适用于接触式,测量范围在10-3Ω?㎝—10 3Ω?㎝的四探针电阻率测试仪的首次检定,后续检定的和使用中检验。对某些多功能的四探针电阻率测试仪或只能测量方块电阻四探针测试仪也同样适用。方块电阻的测量范围在10-2Ω/□—10 2Ω/□。
本规程不适用于二探针、三探针、六探针及方型四探针电阻率测试仪的检定。
Contents of JJG 508-2004
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Keywords:
JJG 508-2004, JJG/T 508-2004, JJGT 508-2004, JJG508-2004, JJG 508, JJG508, JJG/T508-2004, JJG/T 508, JJG/T508, JJGT508-2004, JJGT 508, JJGT508