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Position: Chinese Standard in English/JY/T 010-1996
JY/T 010-1996   General rules for analytical scanning electron microscopy (English Version)
Standard No.: JY/T 010-1996 Status:superseded remind me the status change

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Target Language:English File Format:PDF
Word Count: 3000 words Translation Price(USD):244.0 remind me the price change

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Implemented on:1997-4-1 Delivery: via email in 1 business day

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,2020-12-1,1997-4-1,14113731924133B6EF73E58F04335
Standard No.: JY/T 010-1996
English Name: General rules for analytical scanning electron microscopy
Chinese Name: 现代分析仪器分析方法通则 分析型扫描电子显微镜方法通则
Professional Classification: JY    Professional Standard - Education
Source Content Issued by: MOE
Issued on: 1997-1-23
Implemented on: 1997-4-1
Status: superseded
Superseded by:JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
Superseded on:2020-12-1
Target Language: English
File Format: PDF
Word Count: 3000 words
Translation Price(USD): 244.0
Delivery: via email in 1 business day
1. Scope This Rule is applicable to all kinds of scanning electron microscopes and X-ray energy spectrometers. 2. Definitions 2.1 Secondary electron It refers to the outgoing electron from solid sample, under the action of incident electron, with the energy lower than 50eV, normally represented by SE. 2.2 Backscattered electron It refers to the incident electron reflected by atoms of the solid sample, including elastic and non-elastic back scattered electrons, normally represented by BSE. It is also referred to as reflected electron, represented by RE. The elastic back scattered electrons are those of which the movement direction is totally altered yet the energy basically remains the same; and the non-elastic ones are those of which not only the movement direction is altered, but also the energy is reduced to different extends. 2.3 Magnification The magnification of a scanning electron microscope refers to the linear amplification times of its images, represented by M. If the information of a line on the sample with the length of Ls imaged on the charactron with the length of Lc, the magnification equals to:
Foreword I 1. Scope 2. Definitions 3. Principle 4. Apparatus 5. Samples 6. Analytical Procedures 7. Expression of Analysis Results 8. Safety Precautions
Code of China
Standard
JY/T 010-1996  General rules for analytical scanning electron microscopy (English Version)
Standard No.JY/T 010-1996
Statussuperseded
LanguageEnglish
File FormatPDF
Word Count3000 words
Price(USD)244.0
Implemented on1997-4-1
Deliveryvia email in 1 business day
Detail of JY/T 010-1996
Standard No.
JY/T 010-1996
English Name
General rules for analytical scanning electron microscopy
Chinese Name
现代分析仪器分析方法通则 分析型扫描电子显微镜方法通则
Chinese Classification
Professional Classification
JY
ICS Classification
Issued by
MOE
Issued on
1997-1-23
Implemented on
1997-4-1
Status
superseded
Superseded by
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
Superseded on
2020-12-1
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
3000 words
Price(USD)
244.0
Keywords
JY/T 010-1996, JY 010-1996, JYT 010-1996, JY/T010-1996, JY/T 010, JY/T010, JY010-1996, JY 010, JY010, JYT010-1996, JYT 010, JYT010
Introduction of JY/T 010-1996
1. Scope This Rule is applicable to all kinds of scanning electron microscopes and X-ray energy spectrometers. 2. Definitions 2.1 Secondary electron It refers to the outgoing electron from solid sample, under the action of incident electron, with the energy lower than 50eV, normally represented by SE. 2.2 Backscattered electron It refers to the incident electron reflected by atoms of the solid sample, including elastic and non-elastic back scattered electrons, normally represented by BSE. It is also referred to as reflected electron, represented by RE. The elastic back scattered electrons are those of which the movement direction is totally altered yet the energy basically remains the same; and the non-elastic ones are those of which not only the movement direction is altered, but also the energy is reduced to different extends. 2.3 Magnification The magnification of a scanning electron microscope refers to the linear amplification times of its images, represented by M. If the information of a line on the sample with the length of Ls imaged on the charactron with the length of Lc, the magnification equals to:
Contents of JY/T 010-1996
Foreword I 1. Scope 2. Definitions 3. Principle 4. Apparatus 5. Samples 6. Analytical Procedures 7. Expression of Analysis Results 8. Safety Precautions
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Keywords:
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