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Position: Chinese Standard in English/QJ 1239.3-1987
QJ 1239.3-1987   Condition and Method of Environment Test for Electronic Device - Low Temperature Test (English Version)
Standard No.: QJ 1239.3-1987 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 1500 words Translation Price(USD):45.0 remind me the price change

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Implemented on:1986-10-1 Delivery: via email in 1~3 business day

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,,1986-10-1,0A7006B55013E3EE1419312877937
Standard No.: QJ 1239.3-1987
English Name: Condition and Method of Environment Test for Electronic Device - Low Temperature Test
Chinese Name: 电子设备环境试验条件和方法 低温试验
Chinese Classification: V06    Ambient conditions
Professional Classification: QJ    Professional Standard - Aerospace
Issued on: 1987-07-02
Implemented on: 1986-10-1
Status: valid
Superseding:GJB 150A
Target Language: English
File Format: PDF
Word Count: 1500 words
Translation Price(USD): 45.0
Delivery: via email in 1~3 business day
Code of China
Standard
QJ 1239.3-1987  Condition and Method of Environment Test for Electronic Device - Low Temperature Test (English Version)
Standard No.QJ 1239.3-1987
Statusvalid
LanguageEnglish
File FormatPDF
Word Count1500 words
Price(USD)45.0
Implemented on1986-10-1
Deliveryvia email in 1~3 business day
Detail of QJ 1239.3-1987
Standard No.
QJ 1239.3-1987
English Name
Condition and Method of Environment Test for Electronic Device - Low Temperature Test
Chinese Name
电子设备环境试验条件和方法 低温试验
Chinese Classification
V06
Professional Classification
QJ
ICS Classification
Issued by
Issued on
1987-07-02
Implemented on
1986-10-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
GJB 150A
Language
English
File Format
PDF
Word Count
1500 words
Price(USD)
45.0
Keywords
QJ 1239.3-1987, QJ/T 1239.3-1987, QJT 1239.3-1987, QJ1239.3-1987, QJ 1239.3, QJ1239.3, QJ/T1239.3-1987, QJ/T 1239.3, QJ/T1239.3, QJT1239.3-1987, QJT 1239.3, QJT1239.3
Introduction of QJ 1239.3-1987
Contents of QJ 1239.3-1987
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Keywords:
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