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| Position: Chinese Standard in English/SJ 20636-1997 |
| SJ 20636-1997 Test method for oxygen and carbon contents of large diameter thin silicon wafer in microzone for use in IC (English Version) | |||
| Standard No.: | SJ 20636-1997 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5000 words | Translation Price(USD): | 150.0 remind me the price change |
| Implemented on: | 1997-10-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 20636-1997 |
| English Name: | Test method for oxygen and carbon contents of large diameter thin silicon wafer in microzone for use in IC |
| Chinese Name: | IC用大直径薄硅片的氧、碳含量微区试验方法 |
| Chinese Classification: | L5971 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | State Economic and Trade Commission |
| Issued on: | 1997-06-17 |
| Implemented on: | 1997-10-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 5000 words |
| Translation Price(USD): | 150.0 |
| Delivery: | via email in 1~3 business day |