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| Position: Chinese Standard in English/SJ 2355.7-1983 |
| SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices (English Version) | |||
| Standard No.: | SJ 2355.7-1983 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 3500 words | Translation Price(USD): | 180.0 remind me the price change |
| Implemented on: | 1984-3-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 2355.7-1983 |
| English Name: | Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices |
| Chinese Name: | 半导体发光器件测试方法 发光峰值波长和光谱半宽度的测试方法 |
| Chinese Classification: | F01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 1983-08-15 |
| Implemented on: | 1984-3-1 |
| Status: | valid |
| Superseded by: | SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes |
| Target Language: | English |
| File Format: | |
| Word Count: | 3500 words |
| Translation Price(USD): | 180.0 |
| Delivery: | via email in 1~3 business day |