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| Position: Chinese Standard in English/SJ 2658.9-1986 |
| SJ 2658.9-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for the Intensity Space Distribution and Half-intensity Angle of Radiation (English Version) | |||
| Standard No.: | SJ 2658.9-1986 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 2500 words | Translation Price(USD): | 75.0 remind me the price change |
| Implemented on: | 1986-10-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 2658.9-1986 |
| English Name: | Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for the Intensity Space Distribution and Half-intensity Angle of Radiation |
| Chinese Name: | 半导体红外发光二极管测试方法 辐射强度空间分布和半强度角的测试方法 |
| Chinese Classification: | L53 Semiconductor emitting device |
| Professional Classification: | SJ Professional Standard - Electronics |
| Implemented on: | 1986-10-1 |
| Status: | superseded |
| Superseded by: | SJ/T 2658.9-2015 Measuring method for semiconductor infiared-emitting diode. Part 9: Spatial distribution of radiant intensity and half-intensity angle |
| Superseded on: | 2016-4-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 2500 words |
| Translation Price(USD): | 75.0 |
| Delivery: | via email in 1~3 business day |