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| Position: Chinese Standard in English/SJ/T 10739-1996 |
| SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories (English Version) | |||
| Standard No.: | SJ/T 10739-1996 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 14000 words | Translation Price(USD): | 420.0 remind me the price change |
| Implemented on: | 1997-1-1 | Delivery: | via email in 1~5 business day |
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| Standard No.: | SJ/T 10739-1996 |
| English Name: | Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories |
| Chinese Name: | 半导体集成电路 ＭＯＳ随机存储器测试方法的基本原理 |
| Chinese Classification: | G01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 1996-11-20 |
| Implemented on: | 1997-1-1 |
| Status: | abolished |
| Abolished on: | 2010-01-20 |
| Superseding: | GB 3443-1982 General principles of measuring methods of MOS random access memory for semiconductor integrated circuits |
| Target Language: | English |
| File Format: | |
| Word Count: | 14000 words |
| Translation Price(USD): | 420.0 |
| Delivery: | via email in 1~5 business day |