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| Position: Chinese Standard in English/SJ/T 11399-2009 |
| SJ/T 11399-2009 Measurement methods for chips of light emitting diodes (English Version) | |||
| Standard No.: | SJ/T 11399-2009 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5500 words | Translation Price(USD): | 160.0 remind me the price change |
| Implemented on: | 2010-1-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ/T 11399-2009 |
| English Name: | Measurement methods for chips of light emitting diodes |
| Chinese Name: | 半导体发光二极管芯片测试方法 |
| Chinese Classification: | L45 Microwave and millimeter wave diode and triode |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | Ministry of Industry and Information Technology |
| Issued on: | 2009-11-17 |
| Implemented on: | 2010-1-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Translation Price(USD): | 160.0 |
| Delivery: | via email in 1~3 business day |