SJ/T 11632-2016 English Version, SJ/T 11632-2016 Test method for microcrack defects of silicon wafers for solar cell (English Version)

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SJ/T 11632-2016 Test method for microcrack defects of silicon wafers for solar cell (English Version)
Standard No.:	SJ/T 11632-2016	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	6000 words	Translation Price(USD):	194.0 remind me the price change Email:
Implemented on:	2016-9-1	Delivery:	via email in 1~3 business day

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Standard No.:	SJ/T 11632-2016
English Name:	Test method for microcrack defects of silicon wafers for solar cell
Chinese Name:	太阳能电池用硅片微裂纹缺陷的测试方法
Professional Classification:	SJ Professional Standard - Electronics
Source Content Issued by:	Ministry of Industry and Information Technology
Issued on:	2016-04-05
Implemented on:	2016-9-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	6000 words
Translation Price(USD):	194.0
Delivery:	via email in 1~3 business day

Standard

SJ/T 11632-2016 Test method for microcrack defects of silicon wafers for solar cell (English Version)
Standard No.	SJ/T 11632-2016
Status	valid
Language	English
File Format	PDF
Word Count	6000 words
Price(USD)	194.0
Implemented on	2016-9-1
Delivery	via email in 1~3 business day

Detail of SJ/T 11632-2016

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Introduction of SJ/T 11632-2016

本标准规定了太阳能电池用硅片微裂纹缺陷的测试方法，主要内容包括规范性引用文件、术语和定义、方法原理、干扰因素、仪器设备、试样要求、测试环境、测试程序、精密度和试验报告等。

Contents of SJ/T 11632-2016

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