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| Position: Chinese Standard in English/SJ/T 12037-2025 |
| SJ/T 12037-2025 Artificial intelligence chips—Test metrics and test methods ofdeep learning chips for cloud-side training (English Version) | |||
| Standard No.: | SJ/T 12037-2025 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 11500 words | Translation Price(USD): | 345.0 remind me the price change |
| Implemented on: | Delivery: | via email in 1~5 business day | |
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| Standard No.: | SJ/T 12037-2025 |
| English Name: | Artificial intelligence chips—Test metrics and test methods ofdeep learning chips for cloud-side training |
| Chinese Name: | 人工智能芯片 云侧训练用深度学习芯片测试指标与测试方法 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 2025-05-12 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 11500 words |
| Translation Price(USD): | 345.0 |
| Delivery: | via email in 1~5 business day |