Standard No.:	SJ/T 2214-2015
English Name:	Measuring methods for semiconductor photodiode and phototransistor
Chinese Name:	半导体光电二极管和光电晶体管测试方法
Professional Classification:	SJ    Professional Standard - Electronics
Source Content Issued by:	MIIT
Issued on:	2015-04-30
Implemented on:	2015-10-1
Status:	valid
Superseding:	SJ/T 2214.1~2214.10-1982 SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors SJ 2214.9-1982 Method of measurement for pulse rise and fall time of semiconductor photodiodes and phototransistors SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors
Target Language:	English
File Format:	PDF
Word Count:	14500 words
Translation Price(USD):	564.0
Delivery:	via email in 1~3 business day

标准的主要内容包括半导体光敏管的正向压降暗电流等参数的术语和定义测试原理测试步骤测试条件。