Standard No.:	SJ/T 2354-2015
English Name:	Measuring methods for photodiodes of PIN、APD
Chinese Name:	ＰＩＮ、雪崩光电二极管测试方法
Professional Classification:	SJ    Professional Standard - Electronics
Source Content Issued by:	MIIT
Issued on:	2015-04-30
Implemented on:	2015-10-1
Status:	valid
Superseding:	SJ/T 2354.1~2354.14-1983 SJ 2354.3-1983 Method of measurement for dark current of PIN and avalanche photodiodes SJ 2354.13-1983 Method of measurement for multiplication factor of PIN and avalanche photodiodes SJ 2354.1-1983 General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix SJ 2354.7-1983 Method of measurement for spectral response curve and spectral response range of PIN and avalanche photodiodes SJ 2354.10-1983 Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix SJ 2354.14-1983 Method of measurement for excess noise factor of PIN and avalanche photodiodes SJ 2354.8-1983 Method of measurement for pulse rise time and fall time of PIN and avalanche photodiodes SJ 2354.5-1983 Method of measurement for capacitance of PIN and avalanche photodiodes SJ 2354.2-1983 Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes SJ 2354.9-1983 Method of measurement for noise equivalent power of PIN and avalanche photodiodes SJ 2354.4-1983 Method of measurement for forward voltage drop of PIN and avalanche photodiodes SJ 2354.6-1983 Method of measurement for responsivity of PIN and avalanche photodiodes SJ 2354.12-1983 Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes
Target Language:	English
File Format:	PDF
Word Count:	18000 words
Translation Price(USD):	724.0
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标准的主要内容包括PIN雪崩光电二极管的反向击穿电压暗电流等参数的术语和定义测试原理测试步骤测试条件。