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| Position: Chinese Standard in English/SJ/T 2658.1-2015 |
| SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode -Part 1:General (English Version) | |||
| Standard No.: | SJ/T 2658.1-2015 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 2500 words | Translation Price(USD): | 80.0 remind me the price change |
| Implemented on: | 2016-4-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ/T 2658.1-2015 |
| English Name: | Measuring method for semiconductor infrared-emitting diode -Part 1:General |
| Chinese Name: | 半导体红外发射二极管测量方法 第1部分：总则 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | Ministry of Industry and Information Technology |
| Issued on: | 2015-10-10 |
| Implemented on: | 2016-4-1 |
| Status: | valid |
| Superseding: | SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules |
| Target Language: | English |
| File Format: | |
| Word Count: | 2500 words |
| Translation Price(USD): | 80.0 |
| Delivery: | via email in 1~3 business day |