Standard No.:	T/CITS 201-2024
English Name:	Elemental composition and chemical state analysis for perovskite thin films materials — X-ray photoelectron spectroscopy
Chinese Name:	钙钛矿薄膜材料元素组成及化学态分析 X射线光电子能谱法
Chinese Classification:	N54    Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them
Professional Classification:	T/    Social Organization Standard
ICS Classification:	17.040.20 17.040.20    Properties of surfaces 17.040.20
Source Content Issued by:	T/CITS 201-2024
Issued on:	2024-12-20
Implemented on:	2024-12-20
Status:	valid
Target Language:	English
File Format:	PDF

本文件描述了利用X射线光电子能谱测定钙钛矿薄膜材料的元素组成化学态的实验方法。
本文件适用于基于铅（Pb）基卤化物的钙钛矿薄膜材料的元素组成及化学态测定，其他类型的钙钛矿材料可参照使用。